Search for tag: "lithography (microfabrication)"

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01:00:20 NNCI_REU_Convocation_Session_B_8:40am_8/07/2017 NNCI_REU_Convocation_Session_B_8:40am_8/07/2017	NNCI_REU_Convocation_Session_B_8:40am_8/07/2017 Session B: Global Learning Center Room 323 mechanics electronic engineering databases ultraviolet radiation dielectrics u.v.senescence mineralogy oxide species thin film deposition concepts in physics electron beam mechanical engineering germanium semiconductor materials chemical elements industrial processes electric and magnetic fields in matter mathematical modeling mathematical terminology high electron chemical kinetics research methods u.v mechanical properties heat transfer crystallography temperature quantum electrodynamics c.n.n.electronics terminology chemical properties feature p.p.c.reducing agents biology and pharmacology of chemical elements ventilating core structure electronics p.v.c.pyrotechnic fuels syndromes integrated circuits metadata materials science c.m.ram reaction quality factor physical cosmology oxides connectivity electronics manufacturing computer graphics chemical engineering ratios image quality metalloids manufacturing structure physical quantities force microscopy condensed matter physics oxygen semiconductor device fabrication polymers applied mathematics industry charge carriers heating silicon dietary minerals heat conduction and air conditioning p.m.s.light electrical engineering lithography (microfabrication)property optics s.c.m. From Leslie O'Neill 2 Years ago 70 views 0 name Moderator: David Dikensheets, Montana State University Date 08/07/2017
01:00:31 NNCI_REU_Convocation_Session_C_9:55am_8/07/2017 NNCI_REU_Convocation_Session_C_9:55am_8/07/2017	NNCI_REU_Convocation_Session_C_9:55am_8/07/2017 Session C: Global Learning Center Room 222 profile gerontology process characteristics meetings american brands surface graphic design laboratory equipment computing input devices sociology temperature formal methods create question s.m.continuum mechanics p.m.methodology printing functionality structure contaminant scanning speed phosphorus companies listed on the new york stock exchange integrated circuits physical chemistry development materials science atlantic records albums fabless semiconductor companies p.m.a.transistor calendars graphics software scientific classification ratios paraphilias condition psychology genealogy software engineering semiconductor device fabrication photonics legal terms region software testing thought underexposure optimization death profile demography polymers scan speed lithography (microfabrication)university From Leslie O'Neill 2 Years ago 68 views 0 name Moderator: Lynn Rathbun, Cornell University Date 08/07/2017
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