Using a combination of microscopical techniques, Rich applies polarized light microscopy (PLM), Fourier transform infrared microspectroscopy, (FTIR), confocal Raman microscopy, (CRM), scanning electron microscopy-energy dispersive x-ray spectrometry (SEM-EDS) and transmission electron microscopy (TEM) to solve problems in research and industry. Typically the use of a microscope is the only way to approach problems that involve fine particles that have found their way into or onto a product resulting in some form of contamination. Rich will demonstrate, through the use of case examples, how many particle based problems can be solved using a common sense approach and a strong background in light and electron microscopy.

https://mediaspace.gatech.edu/media/brown_1/1_i4uk3p6f